Title :
State-Sensitive X-Filling Scheme for Scan Capture Power Reduction
Author :
Yang, Jing-ling ; Xu, Qiang
Author_Institution :
Dept. of Comput. Sci. & Eng., Chinese Univ. of Hong Kong, Hong Kong
fDate :
7/1/2008 12:00:00 AM
Abstract :
Based on the operation of a state machine, this paper elucidates a comprehensive frame for probability-based primary-input-dominated X-filling methods to minimize the total weighted switching activity (WSA) during the scan capture operation. Experimental results demonstrate that the proposed approach significantly reduces both average and peak WSAs.
Keywords :
finite state machines; logic testing; sequential circuits; circuit scan testing; probability-based primary-input-dominated X-filling methods; scan capture power reduction; state machine operation; state-sensitive X-filling scheme; weighted switching activity; Automatic test pattern generation; Circuit testing; Computational modeling; Electronics industry; Hamming distance; Power semiconductor switches; Semiconductor device testing; Sequential analysis; Sequential circuits; Switching circuits; Scan test; sequential circuits; switching activity (SA); test generation;
Journal_Title :
Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on
DOI :
10.1109/TCAD.2008.923418
