• DocumentCode
    75517
  • Title

    Low-Power a-Si:H Gate Driver Circuit With Threshold-Voltage-Shift Recovery and Synchronously Controlled Pull-Down Scheme

  • Author

    Chih-Lung Lin ; Mao-Hsun Cheng ; Chun-Da Tu ; Chia-En Wu ; Fu-Hsing Chen

  • Author_Institution
    Dept. of Electr. Eng., Nat. Cheng Kung Univ., Tainan, Taiwan
  • Volume
    62
  • Issue
    1
  • fYear
    2015
  • fDate
    Jan. 2015
  • Firstpage
    136
  • Lastpage
    142
  • Abstract
    This paper presents a new low-power gate driver circuit designed by hydrogenated amorphous silicon thin-film transistors (a-Si:H TFTs). An attempt is also made to reduce the power consumption resulting from the high-frequency pulldown structure, in which a pair of 0.25-Hz clock signals is used to implement a low-frequency and synchronously controlled pull-down scheme for recovering the threshold voltage shifts of a-Si:H TFTs under the negative gate-to-source voltage and decreasing the used TFTs. Measurement results indicate that the proposed gate driver circuit consumes 98.7 μW/stage, and the output waveforms are very stable without distortion when the proposed circuit is operated at 100 °C for 840 h. Furthermore, the feasibility of the proposed gate driver circuit is demonstrated for the quad-extended-video-graphics-array resolution.
  • Keywords
    amorphous semiconductors; driver circuits; hydrogen; low-power electronics; silicon; synchronisation; thin film transistors; Si:H; TFT; clock signal; frequency 0.25 Hz; high-frequency pull-down structure; hydrogenated amorphous silicon thin-film transistor; low-power gate driver circuit; negative gate-to-source voltage; power consumption reduction; quad-extended-video-graphics-array resolution; synchronously controlled pull-down scheme; threshold-voltage-shift recovery; Clocks; Driver circuits; Logic gates; Power demand; Stress; Temperature measurement; Thin film transistors; Gate driver circuit; power consumption; quad-extended video graphics array (QXGA); threshold voltage shift; threshold voltage shift.;
  • fLanguage
    English
  • Journal_Title
    Electron Devices, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9383
  • Type

    jour

  • DOI
    10.1109/TED.2014.2372820
  • Filename
    6975051