Title :
Low noise 9-GHz sapphire resonator-oscillator with thermoelectric temperature stabilization at 300 Kelvin
Author :
Tobar, M.E. ; Ivanov, E.N. ; Woode, R.A. ; Searls, J.H. ; Mann, A.G.
Author_Institution :
Dept. of Phys., Western Australia Univ., Nedlands, WA, Australia
fDate :
4/1/1995 12:00:00 AM
Abstract :
The authors report on an X-band microwave oscillator incorporating a room temperature thermoelectric stabilized sapphire resonator operating at 9.00000 GHz. With a Galani type stabilization scheme they have measured a reduced single sideband phase noise of about -124 dBc/Hz at 1 kHz with a f-3 dependence. The measurement was limited by the flicker noise of the phase detector in the feedback electronics. The frequency stability was also measured; at an integration time of 0.1 seconds a δf/f of about 10-11 with a τ0.7 dependence was measured. The frequency drift strongly correlated with ambient temperature fluctuations
Keywords :
cavity resonators; circuit noise; circuit stability; crystal oscillators; feedback oscillators; frequency stability; microwave oscillators; phase noise; sapphire; 300 K; 9 GHz; Al2O3; Galani type stabilization scheme; SHF; X-band microwave oscillator; feedback electronics; flicker noise; frequency drift; frequency stability; metallic cavity; phase detector; sapphire resonator-oscillator; single sideband phase noise; thermoelectric temperature stabilization; 1f noise; Frequency measurement; Microwave oscillators; Noise measurement; Phase detection; Phase measurement; Phase noise; Temperature; Thermoelectricity; Time measurement;
Journal_Title :
Microwave and Guided Wave Letters, IEEE
