DocumentCode :
755509
Title :
Monte Carlo analysis of the space-charge effect in AlGaAs/GaAs ballistic collection transistors (BCTs) under high current injection
Author :
Nakajima, Hiroki ; Tomizawa, Masaaki ; Ishibashi, Tadao
Author_Institution :
NTT LSI Lab., Kanagawa, Japan
Volume :
39
Issue :
7
fYear :
1992
fDate :
7/1/1992 12:00:00 AM
Firstpage :
1558
Lastpage :
1563
Abstract :
AlGaAs/GaAs ballistic collection transistors (BCTs) are investigated by self-consistent Monte Carlo simulation, focusing on the space-charge effect in the collector region. In addition to the conventional BCT collector structure (i-p+-n+), modified collector structures which have n--p+-n + and p--p+-n+ doping profiles are examined. By taking account of the fact that the collector delay time is composed of transit time and capacitance charging time, it is shown that the n--p+-n+ collector structure is effective for the suppression of the base-widening effect (Kirk effect) compared to the i-p+-n+ or p- -p+-n+ structure. Donors in the n- layer compensate for the negative space charges produced by near-ballistic electrons. For a simulated BCT with an n--p +-n+ collector, the smaller collector capacitance charging time leads to improvement in current-gain cutoff frequency under high current injection
Keywords :
III-V semiconductors; Monte Carlo methods; aluminium compounds; bipolar transistors; doping profiles; gallium arsenide; space-charge-limited conduction; AlGaAs-GaAs; BCT; III-V semiconductors; Kirk effect; ballistic collection transistors; base-widening effect; capacitance charging time; collector capacitance charging time; collector structures; current injection; current-gain cutoff frequency; doping profiles; negative space charges; self-consistent Monte Carlo simulation; space-charge effect; transit time; Capacitance; Current density; Cutoff frequency; Delay effects; Doping profiles; Electrons; Gallium arsenide; Kirk field collapse effect; Monte Carlo methods; Space charge;
fLanguage :
English
Journal_Title :
Electron Devices, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9383
Type :
jour
DOI :
10.1109/16.141219
Filename :
141219
Link To Document :
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