• DocumentCode
    755569
  • Title

    The science and technology of magnetoresistive tunneling memory

  • Author

    Engel, Brad N. ; Rizzo, Nicholas D. ; Janesky, Jason ; Slaughter, Jon M. ; Dave, Renu ; DeHerrera, Mark ; Durlam, Mark ; Tehrani, Saied

  • Author_Institution
    Phys. Sci. Res. Labs., Motorola Labs., Tempe, AZ, USA
  • Volume
    1
  • Issue
    1
  • fYear
    2002
  • fDate
    3/1/2002 12:00:00 AM
  • Firstpage
    32
  • Lastpage
    38
  • Abstract
    Rapid advances in portable communication and computing systems are creating an increasing demand for nonvolatile random access memory that is both high-density and highspeed. Existing solid-state technologies are unable to provide all of the needed attributes in a single memory solution. Therefore, a number of different memories are currently being used to achieve the multiple functionality requirements, often compromising performance and adding cost to the system. A new technology, magnetoresistive random access memory (MRAM) based on magnetoresistive tunneling, has the potential to replace these memories in various systems with a single, universal solution. The key attributes of MRAM are nonvolatility, high-speed operation. and unlimited read and write endurance. This technology is enabled by the ability to deposit high-quality, nanometer scale tunneling barriers that display enhanced magnetoresistive response. In this article we describe several fundamental technical and scientific aspects of MRAM with emphasis on recent accomplishments that enabled our successful demonstration of a 256-Kb memory chip
  • Keywords
    high-speed integrated circuits; magnetoresistive devices; nanotechnology; random-access storage; tunnelling; 256 Kbit; MRAM; high-speed operation; magnetoresistive random access memory; magnetoresistive tunneling memory; nanometer scale tunneling barriers; nonvolatile random access memory; read endurance; write endurance; CMOS technology; Enhanced magnetoresistance; Magnetic materials; Magnetic switching; Magnetic tunneling; Nonvolatile memory; Portable computers; Random access memory; Solid state circuits; Tunneling magnetoresistance;
  • fLanguage
    English
  • Journal_Title
    Nanotechnology, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    1536-125X
  • Type

    jour

  • DOI
    10.1109/TNANO.2002.1005424
  • Filename
    1005424