DocumentCode :
755677
Title :
DEIS fellows named
Volume :
21
Issue :
2
fYear :
2005
Firstpage :
41
Lastpage :
43
Keywords :
Aging; Dielectrics and electrical insulation; Electric breakdown; Insulation testing; Polymers; Power transformer insulation; Reliability engineering; Rotating machines; Thermal degradation; Trees - insulation;
fLanguage :
English
Journal_Title :
Electrical Insulation Magazine, IEEE
Publisher :
ieee
ISSN :
0883-7554
Type :
jour
DOI :
10.1109/MEI.2005.1412220
Filename :
1412220
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=755677
