Title :
Stochastic Evaluation of Magnetic Head Wears in Hard Disk Drives
Author :
Yu Wang ; Zhi-Sheng Ye ; Kwok-Leung Tsui
Author_Institution :
State Key Lab. for Manuf. & Syst. Eng., Xi´an Jiaotong Univ., Xi´an, China
Abstract :
Head wear becomes inevitable as the physical clearance between the head and disk in current hard disk drives is close to 1 nm or lower. Accurate characterization of the wear process is essential in understanding the wear mechanism, evaluating the reliability of hard disk drives (HDDs), and predicting the future evolution of wear as well as guiding the design of HDDs of later vintages. Due to the variations in the material and geometry of magnetic head, the wear process is dynamic and stochastic. To cope with the dynamics, a Wiener process with a positive drift is used to model the wear process. Furthermore, to evaluate the reliability quickly, an accelerated degradation model using the wear measurements is developed, from which the parameters/failure times under light loads can be effectively predicted. The developed model is then applied to a real wear problem of magnetic head to demonstrate the effectiveness.
Keywords :
disc drives; hard discs; magnetic heads; stochastic processes; wear; Wiener process; accelerated degradation model; hard disk drives; magnetic head wears; reliability; stochastic evaluation; wear mechanism; Data models; Degradation; Force; Load modeling; Magnetic heads; Reliability; Stress; Accelerated degradation test; Wiener process; accelerated degradation test; head wear; wiener process;
Journal_Title :
Magnetics, IEEE Transactions on
DOI :
10.1109/TMAG.2013.2293636