Title :
Programmable single-electron transistor logic for future low-power intelligent LSI: proposal and room-temperature operation
Author :
Uchida, Ken ; Koga, Junji ; Ohba, Ryuji ; Toriumi, Akira
Author_Institution :
Adv. LSI Technol. Lab., Toshiba Corp., Yokohama, Japan
fDate :
7/1/2003 12:00:00 AM
Abstract :
This paper proposes, for the first time, the concept of programmable logic circuit realized with single-electron transistors (SETs). An SET having nonvolatile memory function is a key element for the programmable SET logic. The writing and erasing operations of the nonvolatile memory function make it possible to tune the phase of Coulomb oscillations. The half-period phase shift induced by the memory function makes the function of SETs complementary to that of the conventional SETs. As a result, SETs having nonvolatile memory function have the functionality of both the conventional (nMOS-like) SETs and the complementary (pMOS-like) SETs. By utilizing this fact, the function of SET circuits can be programmed with great flexibility, on the basis of the information stored by the memory functions. We have successfully fabricated SETs that operate at room temperature and observed the highest room-temperature peak-to-valley current ratio of Coulomb oscillations. The operation of the programmable SET logic is demonstrated using the room-temperature operating SETs. This is the first demonstration of room-temperature SET logic operation. The proposed programmable SET logic provides the potential for low-power, intelligent LSI chips suitable for mobile applications.
Keywords :
large scale integration; low-power electronics; programmable logic devices; single electron transistors; Coulomb oscillation; low-power intelligent LSI chip; nonvolatile memory function; peak-to-valley current ratio; programmable logic circuit; room-temperature operation; single electron transistor; CMOS logic circuits; Large scale integration; Logic circuits; Logic devices; Nonvolatile memory; Proposals; Quantum dots; Research and development; Single electron transistors; Temperature;
Journal_Title :
Electron Devices, IEEE Transactions on
DOI :
10.1109/TED.2003.813909