Title : 
A 12-Bit 75-MS/s Pipelined ADC Using Incomplete Settling
         
        
            Author : 
Iroaga, Echere ; Murmann, Boris
         
        
            Author_Institution : 
Dept. of Electr. Eng., Stanford Univ., CA
         
        
        
        
        
            fDate : 
4/1/2007 12:00:00 AM
         
        
        
        
            Abstract : 
The residue amplifiers in high-speed pipelined analog-to-digital converters (ADCs) typically determine the converter´s overall speed and power performance. We propose a mixed-signal technique that exploits incomplete settling to achieve low power residue amplification. In the first stage of a 12-bit, 75-MS/s proof-of-concept prototype, the employed open-loop residue amplifier dissipates only 2.9 mW from a 3-V supply, achieving >60% amplifier power reduction over a previously reported open-loop residue amplifier implementation and achieving >90% amplifier power reduction over a conventional opamp implementation. Test results show that the converter´s maximum signal-to-noise-and-distortion ratio (SNDR) is 65.6 dB. The measured integral and differential nonlinearity are 0.95 LSB and 0.64 LSB, respectively. The experimental chip occupies 7.9 mm2 and consumes 273 mW in a 0.35-mum double-poly, quadruple-metal CMOS process
         
        
            Keywords : 
CMOS integrated circuits; amplifiers; analogue-digital conversion; low-power electronics; mixed analogue-digital integrated circuits; parallel architectures; 0.35 micron; 12 bit; 2.9 mW; 273 mW; 3 V; SNDR; amplifier power reduction; analog-to-digital converters; differential nonlinearity; double-poly quadruple-metal CMOS process; incomplete settling; integral nonlinearity; low power residue amplification; mixed-signal technique; open-loop residue amplifier; pipelined ADC; signal-to-noise-and-distortion ratio; Analog-digital conversion; CMOS technology; Calibration; Circuits; Gain; High power amplifiers; Pipelines; Power amplifiers; Power dissipation; Prototypes; Adaptive systems; CMOS integrated circuits; analog-to-digital conversion; digital background calibration;
         
        
        
            Journal_Title : 
Solid-State Circuits, IEEE Journal of
         
        
        
        
        
            DOI : 
10.1109/JSSC.2007.892154