CMOS Smart Sensor for Monitoring the Quality of Perishables

Author

Ueno, Ken ; Hirose, Tetsuya ; Asai, Tetsuya ; Amemiya, Yoshihito

Author_Institution

Dept. of Electr. Eng., Hokkaido Univ., Sapporo

Volume

42

Issue

4

fYear

2007

fDate

4/1/2007 12:00:00 AM

Firstpage

798

Lastpage

803

Abstract

We developed a CMOS integrated-circuit sensor to monitor the change in quality of perishables that depends on surrounding temperatures. Our sensor makes use of the fact that the temperature dependence of the subthreshold current in MOSFETs is analogous to that of the degradation of perishables. The sensor is attached to perishable goods such as farm and marine products and is distributed from producers to consumers along with the goods. During their distribution process, the sensor measures the surrounding temperatures and emulates the degradation of the goods caused by the temperature. By reading the output of the sensor, consumers can determine whether the goods are fresh or not. Our sensor consists of subthreshold CMOS circuits with a low-power consumption of 10 muW or lower

Keywords

CMOS integrated circuits; goods distribution; intelligent sensors; quality control; temperature sensors; CMOS smart sensor; MOSFET; low-power consumption; perishable goods; perishables quality monitoring; quality guarantee; subthreshold CMOS circuits; subthreshold current; temperature measurement; Circuits; Degradation; Intelligent sensors; MOSFETs; Monitoring; Subthreshold current; Temperature dependence; Temperature distribution; Temperature measurement; Temperature sensors; CMOS; perishable; quality guarantee; smart sensor; subthreshold current; translinear;

fLanguage

English

Journal_Title

Solid-State Circuits, IEEE Journal of

Publisher

ieee

ISSN

0018-9200

Type

jour

DOI

10.1109/JSSC.2007.891676

Filename

4140599