DocumentCode :
756716
Title :
Power-amplifier characterization using a two-tone measurement technique
Author :
Clark, Christopher J. ; Silva, Christopher P. ; Moulthrop, Andrew A. ; Muha, Michael S.
Author_Institution :
Multilink Technol. Corp., Santa Monica, CA, USA
Volume :
50
Issue :
6
fYear :
2002
fDate :
6/1/2002 12:00:00 AM
Firstpage :
1590
Lastpage :
1602
Abstract :
An accurate nonlinear model is necessary to optimize the tradeoff between efficiency and linearity in power amplifiers. Gain compression (AM/AM) and amplitude-phase (AM/PM) distortion are the two primary model inputs used to characterize the nonlinearity. The amplifier´s AM/AM and AM/PM characteristics are typically measured statically using a vector network analyzer. Since the input is typically a modulated signal, it is desirable to characterize the amplifier dynamically. This paper describes and demonstrates a dynamic AM/AM and AM/PM measurement and modeling technique involving a spectrum analyzer and two-tone input signals. A complete analysis of the measurement technique is presented, along with the data processing needed for the identification of a new three-box model. The test configuration and procedure are presented with special precautions to minimize measurement error. Results for a solid-state amplifier are used to accurately predict intermodulation distortion, while those for a traveling-wave tube amplifier show good agreement with that obtained dynamically using a 16 quadrature-amplitude-modulation signal
Keywords :
amplitude modulation; intermodulation distortion; measurement errors; microwave measurement; microwave power amplifiers; phase modulation; spectral analysers; travelling wave amplifiers; AM/AM characteristics; AM/PM characteristics; amplitude-phase distortion; data processing; gain compression; intermodulation distortion; measurement error; nonlinear model; power-amplifier characterization; primary model inputs; solid-state amplifier; spectrum analyzer; three-box model; traveling-wave tube amplifier; two-tone measurement technique; Data processing; Distortion measurement; Linearity; Measurement errors; Measurement techniques; Nonlinear distortion; Power amplifiers; Solid state circuits; Spectral analysis; Testing;
fLanguage :
English
Journal_Title :
Microwave Theory and Techniques, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9480
Type :
jour
DOI :
10.1109/TMTT.2002.1006421
Filename :
1006421
Link To Document :
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