DocumentCode
757
Title
Investigation of Static and Dynamic Characteristics of Optically Controlled Field Effect Transistors
Author
Colace, Lorenzo ; Sorianello, V. ; Ramajani, Saravanan
Author_Institution
Dept. of Eng., Univ. Roma Tre, Rome, Italy
Volume
32
Issue
12
fYear
2014
fDate
June15, 15 2014
Firstpage
2233
Lastpage
2239
Abstract
In this paper, we report on an optically controlled field effect transistor (OCFET). The device is based on a modified MOSFET geometry with a Germanium layer interposed between the gate oxide and the gate metal contact. The investigation is performed using the technology computer aided design tool. We describe the principle of operation and investigate the static and dynamic properties of the OCFET under near infrared light at 1.55 μm. Device performance in terms of both ON/OFF current ratio and switching times are studied versus design parameters such as Germanium doping and lifetime as well as gate bias voltage and optical power. Strategies toward best operating conditions and satisfactory tradeoff are investigated and discussed along with future perspective and possible fundamental limitations.
Keywords
MOSFET; elemental semiconductors; germanium; phototransistors; semiconductor doping; technology CAD (electronics); Ge; OCFET; ON-OFF current ratio; design parameters; dynamic characteristics; gate bias voltage; gate metal contact; gate oxide; germanium doping; germanium layer; modified MOSFET geometry; near infrared light; optical power; optically controlled field effect transistors; static characteristics; switching time; technology computer aided design tool; wavelength 1.55 mum; Doping; Electric fields; Logic gates; Optical amplifiers; Optical pulses; Particle beam optics; Silicon; Ge-on-Si; optical interconnects; optically controlled transistor; photodetectors; phototransistors;
fLanguage
English
Journal_Title
Lightwave Technology, Journal of
Publisher
ieee
ISSN
0733-8724
Type
jour
DOI
10.1109/JLT.2014.2322978
Filename
6813642
Link To Document