• DocumentCode
    757
  • Title

    Investigation of Static and Dynamic Characteristics of Optically Controlled Field Effect Transistors

  • Author

    Colace, Lorenzo ; Sorianello, V. ; Ramajani, Saravanan

  • Author_Institution
    Dept. of Eng., Univ. Roma Tre, Rome, Italy
  • Volume
    32
  • Issue
    12
  • fYear
    2014
  • fDate
    June15, 15 2014
  • Firstpage
    2233
  • Lastpage
    2239
  • Abstract
    In this paper, we report on an optically controlled field effect transistor (OCFET). The device is based on a modified MOSFET geometry with a Germanium layer interposed between the gate oxide and the gate metal contact. The investigation is performed using the technology computer aided design tool. We describe the principle of operation and investigate the static and dynamic properties of the OCFET under near infrared light at 1.55 μm. Device performance in terms of both ON/OFF current ratio and switching times are studied versus design parameters such as Germanium doping and lifetime as well as gate bias voltage and optical power. Strategies toward best operating conditions and satisfactory tradeoff are investigated and discussed along with future perspective and possible fundamental limitations.
  • Keywords
    MOSFET; elemental semiconductors; germanium; phototransistors; semiconductor doping; technology CAD (electronics); Ge; OCFET; ON-OFF current ratio; design parameters; dynamic characteristics; gate bias voltage; gate metal contact; gate oxide; germanium doping; germanium layer; modified MOSFET geometry; near infrared light; optical power; optically controlled field effect transistors; static characteristics; switching time; technology computer aided design tool; wavelength 1.55 mum; Doping; Electric fields; Logic gates; Optical amplifiers; Optical pulses; Particle beam optics; Silicon; Ge-on-Si; optical interconnects; optically controlled transistor; photodetectors; phototransistors;
  • fLanguage
    English
  • Journal_Title
    Lightwave Technology, Journal of
  • Publisher
    ieee
  • ISSN
    0733-8724
  • Type

    jour

  • DOI
    10.1109/JLT.2014.2322978
  • Filename
    6813642