DocumentCode :
757
Title :
Investigation of Static and Dynamic Characteristics of Optically Controlled Field Effect Transistors
Author :
Colace, Lorenzo ; Sorianello, V. ; Ramajani, Saravanan
Author_Institution :
Dept. of Eng., Univ. Roma Tre, Rome, Italy
Volume :
32
Issue :
12
fYear :
2014
fDate :
June15, 15 2014
Firstpage :
2233
Lastpage :
2239
Abstract :
In this paper, we report on an optically controlled field effect transistor (OCFET). The device is based on a modified MOSFET geometry with a Germanium layer interposed between the gate oxide and the gate metal contact. The investigation is performed using the technology computer aided design tool. We describe the principle of operation and investigate the static and dynamic properties of the OCFET under near infrared light at 1.55 μm. Device performance in terms of both ON/OFF current ratio and switching times are studied versus design parameters such as Germanium doping and lifetime as well as gate bias voltage and optical power. Strategies toward best operating conditions and satisfactory tradeoff are investigated and discussed along with future perspective and possible fundamental limitations.
Keywords :
MOSFET; elemental semiconductors; germanium; phototransistors; semiconductor doping; technology CAD (electronics); Ge; OCFET; ON-OFF current ratio; design parameters; dynamic characteristics; gate bias voltage; gate metal contact; gate oxide; germanium doping; germanium layer; modified MOSFET geometry; near infrared light; optical power; optically controlled field effect transistors; static characteristics; switching time; technology computer aided design tool; wavelength 1.55 mum; Doping; Electric fields; Logic gates; Optical amplifiers; Optical pulses; Particle beam optics; Silicon; Ge-on-Si; optical interconnects; optically controlled transistor; photodetectors; phototransistors;
fLanguage :
English
Journal_Title :
Lightwave Technology, Journal of
Publisher :
ieee
ISSN :
0733-8724
Type :
jour
DOI :
10.1109/JLT.2014.2322978
Filename :
6813642
Link To Document :
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