DocumentCode :
757139
Title :
Reliability growth-Myth or mess
Author :
Wong, Kam L.
Author_Institution :
Kambea Ind., Manhattan Beach, CA, USA
Volume :
37
Issue :
2
fYear :
1988
fDate :
6/1/1988 12:00:00 AM
Firstpage :
209
Abstract :
The author argues that reliability growth is not necessarily well defined in the literature. Therefore he suggests that in all papers on reliability growth the author should identify what kind of reliability growth process they have in mind and, if data are being analyzed, which factors are held constant or randomized to smooth out the effects
Keywords :
reliability theory; reliability growth; Aging; Calendars; Costs; Electronic equipment; Electronic equipment manufacture; Fungi; Mathematical model; Production; Satellites; Testing;
fLanguage :
English
Journal_Title :
Reliability, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9529
Type :
jour
DOI :
10.1109/24.3742
Filename :
3742
Link To Document :
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