• DocumentCode
    757145
  • Title

    A new cluster isolation criterion based on dissimilarity increments

  • Author

    Fred, Ana L N ; Leitã, José M N

  • Author_Institution
    Instituto de Telecomunicaoes, Instituto Superior Tecnico, Lisbon, Portugal
  • Volume
    25
  • Issue
    8
  • fYear
    2003
  • Firstpage
    944
  • Lastpage
    958
  • Abstract
    This paper addresses the problem of cluster defining criteria by proposing a model-based characterization of interpattern relationships. Taking a dissimilarity matrix between patterns as the basic measure for extracting group structure, dissimilarity increments between neighboring patterns within a cluster are analyzed. Empirical evidence suggests modeling the statistical distribution of these increments by an exponential density; we propose to use this statistical model, which characterizes context, to derive a new cluster isolation criterion. The integration of this criterion in a hierarchical agglomerative clustering framework produces a partitioning of the data, while exhibiting data interrelationships in terms of a dendrogram-type graph. The analysis of the criterion is undertaken through a set of examples, showing the versatility of the method in identifying clusters with arbitrary shape and size; the number of clusters is intrinsically found without requiring ad hoc specification of design parameters nor engaging in a computationally demanding optimization procedure.
  • Keywords
    graph theory; pattern clustering; statistical analysis; cluster isolation criterion; dendrogram-type graph; dissimilarity increments; dissimilarity matrix; exponential density; hierarchical agglomerative clustering framework; interpattern relationships; model-based characterization; pattern clustering; statistical distribution; Clustering algorithms; Clustering methods; Context modeling; Design optimization; Machine learning algorithms; Partitioning algorithms; Pattern analysis; Prototypes; Shape; Statistical distributions;
  • fLanguage
    English
  • Journal_Title
    Pattern Analysis and Machine Intelligence, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0162-8828
  • Type

    jour

  • DOI
    10.1109/TPAMI.2003.1217600
  • Filename
    1217600