DocumentCode :
757167
Title :
Readout ASIC for 3D Position-Sensitive Detectors
Author :
Geronimo, Gianluigi De ; Vernon, Emerson ; Ackley, Kim ; Dragone, Angelo ; Fried, Jack ; Connor, Paul O. ; He, Zhong ; Herman, Cedric ; Zhang, Feng
Author_Institution :
Instrum. Div., Brookhaven Nat. Lab., Upton, NY
Volume :
55
Issue :
3
fYear :
2008
fDate :
6/1/2008 12:00:00 AM
Firstpage :
1593
Lastpage :
1603
Abstract :
We describe an application specific integrated circuit (ASIC) for 3D position-sensitive detectors. It was optimized for pixelated cadmium-zinc-telluride (CZT) sensors, and it measures, corresponding to an ionizing event, the energy and timing of signals from 121 anodes and one cathode. Each channel provides low-noise charge amplification, high-order shaping, along with peak- and timing-detection. The cathode´s timing can be measured in three different ways: the first is based on multiple thresholds on the charge amplifier´s voltage output; the second uses the threshold crossing of a fast-shaped signal; and the third measures the peak amplitude and timing from a bipolar shaper. With its power of 2 mW per channel the ASIC measures, on a CZT sensor connected and biased, charges up to 100 fC with an electronic resolution better than 200 e- rms. Our preliminary spectral measurements applying a simple cathode/anode ratio correction demonstrated a single-pixel resolution of 4.8 keV (0.72 %) at 662 keV, with the electronics and leakage current contributing in total with 2.1 keV.
Keywords :
application specific integrated circuits; leakage currents; nuclear electronics; position sensitive particle detectors; readout electronics; semiconductor counters; 3D position-sensitive detectors; CZT; anode signal timing; application specific integrated circuit; bipolar shaper; cathode signal timing; charge amplifiers voltage output; electron volt energy 2.1 keV; electron volt energy 4.8 keV; electron volt energy 662 keV; electronic resolution; ionizing event; leakage current; low-noise charge amplification; multiple thresholds; peak detection; pixelated cadmium-zinc-telluride sensors; readout ASIC; spectral measurements; timing-detection; Anodes; Application specific integrated circuits; Cathodes; Charge measurement; Current measurement; Energy measurement; Integrated circuit measurements; Position sensitive particle detectors; Shape measurement; Timing; 3D; Application specific integrated circuit (ASIC); Cadmium–Zinc–Telluride (CZT); timing;
fLanguage :
English
Journal_Title :
Nuclear Science, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9499
Type :
jour
DOI :
10.1109/TNS.2008.922217
Filename :
4545103
Link To Document :
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