Title :
A Bayes empirical-Bayes model for software reliability
Author :
Mazzuchi, Thomas A. ; Soyer, Refik
Author_Institution :
George Washington Univ., Washington, DC, USA
fDate :
6/1/1988 12:00:00 AM
Abstract :
The authors present a model for the behavior of software failures. Their model fits into the general framework of empirical Bayes problems; however, they take a proper Bayes approach for inference by viewing the situation as a Bayes empirical-Bayes problem. An approximation due to D.V. Lindley (1980) plays a central role in the analysis. They show that the Littlewood-Verall model (1973) is an empirical Bayes model and discuss a fully Bayes analysis of it using the Bayes empirical-Bayes setup. Finally, they apply both models to some actual software failure data and compare their predictive performance
Keywords :
Bayes methods; software reliability; Bayes empirical-Bayes model; Littlewood-Verall model; software failures; software reliability; Error correction; Failure analysis; Probability; Reliability theory; Software measurement; Software performance; Software reliability; Software testing; Statistical analysis; Stochastic processes;
Journal_Title :
Reliability, IEEE Transactions on