Title :
Optically Modulated MEMS scanning endoscope
Author :
Chong, Changho ; Isamoto, Keiji ; Toshiyoshi, Hiroshi
Author_Institution :
Santec Corp., Aichi, Japan
Abstract :
This letter presents a novel configuration of a microelectrical-mechanical system (MEMS) scanning endoscope that is actuated by external optical modulation. Light at a wavelength in the 1550-nm range is used to modulate a scanning MEMS mirror. The instrument also provides for the delivery of a second beam at a wavelength of 1310 nm, commonly used for medical diagnostic applications such as optical coherence tomography. The two wavelengths are combined with using a wavelength-division multiplexing filter and launched into a single-mode fiber. This novel approach provides for the operation of a scanning endoscope without the need for directly powering up the scanning element. In this way a less hazardous apparatus for in vivo diagnosis is possible. The design of the module and MEMS scanning mirror is discussed. A fabricated module is demonstrated in which a MEMS mirror scans at the resonant frequency of 350 Hz, generating an optical scanning angle of 8°.
Keywords :
biomedical optical imaging; endoscopes; fibre optic sensors; microactuators; micromirrors; optical design techniques; optical fibres; optical filters; optical modulation; optical scanners; optical tomography; photodetectors; wavelength division multiplexing; 1310 nm; 1550 nm; 350 Hz; MEMS; in vivo diagnosis; medical diagnostic applications; optical coherence tomography; optical scanning angle; optically modulation; photovoltaic detectors; scanning MEMS mirror; scanning endoscope; single-mode fiber; wavelength-division multiplexing filter; Biomedical optical imaging; Coherence; Endoscopes; Instruments; Medical diagnosis; Micromechanical devices; Mirrors; Optical filters; Optical modulation; Tomography; Endoscopes; microelectrical–mechanical system (MEMS) mirror; optical coherence tomography; photovoltaic detector; wavelength-division multiplexing (WDM) filter;
Journal_Title :
Photonics Technology Letters, IEEE
DOI :
10.1109/LPT.2005.860050