DocumentCode
757339
Title
Test Program Generation for Communication Peripherals in Processor-Based SoC Devices
Author
Apostolakis, Andreas ; Gizopoulos, Dimitris ; Psarakis, Mihalis ; Ravotto, Danilo ; Reorda, Matteo Sonza
Author_Institution
Univ. of Piraeus, Piraeus
Volume
26
Issue
2
fYear
2009
Firstpage
52
Lastpage
63
Abstract
Testing communication peripherals in an environment of systems on a chip is particularly challenging. The authors explore two test program generation approaches-one fully automated and one deterministically guided-and propose a novel combination of the two schemes that can be applied in a generic manner on a wide set of communication cores.
Keywords
integrated circuit testing; system-on-chip; communication peripherals; processor-based SoC devices; test program generation; Automatic testing; Built-in self-test; Circuit testing; Costs; Hardware; Manufacturing; Software testing; System testing; System-on-a-chip; Time to market;
fLanguage
English
Journal_Title
Design & Test of Computers, IEEE
Publisher
ieee
ISSN
0740-7475
Type
jour
DOI
10.1109/MDT.2009.43
Filename
4850411
Link To Document