DocumentCode :
75753
Title :
Chaotic Oscillations in Josephson Junctions for Random Number Generation
Author :
Shimakage, Hisashi ; Tamura, Yoshinobu
Author_Institution :
Ibaraki Univ., Hitachi, Japan
Volume :
25
Issue :
3
fYear :
2015
fDate :
Jun-15
Firstpage :
1
Lastpage :
4
Abstract :
We investigated chaos generation in Josephson junctions by numerical simulations for the purpose of applying it to physical random number generators. In the simulations, an RCSJ model by the current bias was used. Current biases were applied to the Josephson junctions and calculated the time evolution signal of the voltage when they were irradiated with an external microwave. To judge whether the chaos signals were generated, Lyapunov exponents, calculated by Shimada-Nagashima algorithm, were used. In the mapping of chaos-generating regions, a certain kind of regularity was observed. The high-frequency component was cut from the acquired chaotic signal, and the simulation of random number generation was done. The autocorrelation function from the time series data was obtained like a delta-function, which suggested that it has nearly perfect random nature. The binary data sequence, which was assumed to be 0 and 1 by the upper and lower sides of a threshold voltage, was verified by a statistical evaluation (NIST SP 800-22).
Keywords :
Josephson effect; chaos generators; random number generation; time series; Josephson junction; Lyapunov exponents; RCSJ model; Shimada-Nagashima algorithm; autocorrelation function; binary data sequence; chaos signal generation; chaotic oscillations; current bias; delta-function; high-frequency component; numerical simulations; random number generators; statistical evaluation; threshold voltage; time evolution signal; time series data; Chaos; Generators; Josephson junctions; Junctions; Numerical models; Oscillators; Random number generation; Chaos; Josephson junction; Lyapunov exponent; chaos; random number;
fLanguage :
English
Journal_Title :
Applied Superconductivity, IEEE Transactions on
Publisher :
ieee
ISSN :
1051-8223
Type :
jour
DOI :
10.1109/TASC.2014.2377240
Filename :
6975070
Link To Document :
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