Title :
Niobium microbolometers for far-infrared detection
Author :
MacDonald, Michael E. ; Grossman, Erich N.
Author_Institution :
Nat. Inst. of Stand. & Technol., Boulder, CO, USA
fDate :
4/1/1995 12:00:00 AM
Abstract :
Microbolometers have been fabricated using a thin niobium film as the detector element. These detectors operate at room temperature, are impedance matched to planar antennas, and are suitable for broadband use at far-infrared wavelengths. We have achieved responsivities of up to 21 V/W at a bias of 6.4 mA, and electrical noise equivalent powers (NEP) of as low as 1.1×10-10 W/√(Hz) at 1 kHz at a bias of 3.6 mA. At this bias, the detectors are 1/f-noise limited below 1 kHz and are Johnson noise limited above 10 kHz. The 1/f noise in V/√(Hz) increases approximately linearly with bias with a typical level of 0.39 I(mA)/√(f(kHz)) This level of 1/f noise is approximately a factor of 7 below the best reported for bismuth microbolometers
Keywords :
1/f noise; bolometers; impedance matching; infrared detectors; niobium; thermal noise; 1/f-noise limited; 3.6 mA; 6.4 mA; Johnson noise limited; Nb; detector element; electrical noise equivalent powers; far-infrared detection; far-infrared wavelengths; impedance matching; microbolometers; planar antennas; responsivities; room temperature operation; Bismuth; Bolometers; Detectors; Dielectric substrates; Impedance; Linear approximation; Niobium; Noise level; Planar arrays; Temperature;
Journal_Title :
Microwave Theory and Techniques, IEEE Transactions on