DocumentCode :
757753
Title :
Measurements of noise in Josephson-effect mixers
Author :
Schoelkopf, Robert J. ; Zmuidzinas, Jonas ; Phillips, Thomas G. ; LeDuc, Henry G. ; Stern, Jeffrey A.
Author_Institution :
Jet Propulsion Lab., California Inst. of Technol., Pasadena, CA, USA
Volume :
43
Issue :
4
fYear :
1995
fDate :
4/1/1995 12:00:00 AM
Firstpage :
977
Lastpage :
983
Abstract :
We present new heterodyne receiver results obtained at 100 GHz using resistively-shunted Nb and NbN tunnel junctions. In addition, we have carried out accurate measurements of the available noise power of these devices at the L-band (1.5 GHz) IF frequency. Both the heterodyne and the output noise measurements show that the noise of these devices can be a factor of five or more higher than that predicted by the simple current-biased RSJ model. The noise approaches the appropriate thermal or thermal and shot noise limits for bias voltages where the nonlinearity is not strong (i.e., V>ICRN), but as expected from the RSJ model, can be significantly higher at the low voltages where the mixers are typically biased. The bias voltage dependence of the noise shows structure which is associated with resonances in the RF embedding circuit. Surprisingly, we find that changes in the high-frequency (100 GHz) impedance presented to the junction can dramatically affect the magnitude and voltage dependence of the low-frequency (1.5 GHz) noise. This emphasizes the necessity of very closely matching the junction to free space over a wide frequency range
Keywords :
Josephson effect; millimetre wave mixers; millimetre wave receivers; niobium; niobium compounds; shot noise; superconducting device noise; superconducting device testing; thermal noise; 1.5 GHz; 100 GHz; IF frequency; Josephson-effect mixers; L-band; Nb; NbN; available noise power; bias voltage; heterodyne receiver results; resistively-shunted tunnel junctions; shot noise limits; thermal noise limits; voltage dependence; wide frequency range; Circuit noise; Frequency measurement; L-band; Low voltage; Low-frequency noise; Niobium; Noise measurement; Power measurement; Predictive models; Resonance;
fLanguage :
English
Journal_Title :
Microwave Theory and Techniques, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9480
Type :
jour
DOI :
10.1109/22.375263
Filename :
375263
Link To Document :
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