DocumentCode
757802
Title
Scintillation Response Comparison Among Ce-Doped Aluminum Garnets, Perovskites and Orthosilicates
Author
Mares, Jiri A. ; Nikl, Martin ; Mihokova, Eva ; Beitlerova, Alena ; Vedda, Anna ; Ambrosio, Carmelo D.
Author_Institution
Inst. of Phys. AS CR, Prague
Volume
55
Issue
3
fYear
2008
fDate
6/1/2008 12:00:00 AM
Firstpage
1142
Lastpage
1147
Abstract
This paper deals with some aspects of scintillation response of Ce-doped Y-Lu aluminum garnets or perovskites in comparison with Ce-doped orthosilicates. An essential difference between the Ce-doped aluminum garnets/perovskites and orthosilicates consists in larger fluctuations of photoelectron yield of the latter scintillators where differences can reach up to 50% and measured values critically depend on the recent history of the sample (illumination by day light, thermal annealing, etc.). This behavior of Ce-doped silicates seems to be due to the vicinity of the 5d1 level of Ce3+ from the conduction band, which makes the material more sensitive to the presence of deep electron traps monitored by thermo-luminescence above room temperature. The presence of such electron trapping sites thus appears more critical than in aluminum garnets/perovskites.
Keywords
annealing; colour centres; conduction bands; doping; electron traps; lutetium compounds; photomultipliers; solid scintillation detectors; thermoluminescence; vacancies (crystal); yttrium compounds; Lu2SiO5:Ce; Lu3Al5O12:Ce; LuYSiO5:Ce; YAl5O12:Ce; cerium doped aluminum garnets; cerium doped perovskites; cerium-doped orthosilicates; colour centres; conduction band; deep electron traps; hybrid photomultiplier; illumination; oxygen vacancies; photoelectron yield fluctuations; scintillation response; scintillators; thermal annealing; thermoluminescence; Aluminum; Annealing; Conducting materials; Electron traps; Fluctuations; Garnets; History; Lighting; Monitoring; Temperature sensors; Ce-doping; Y-Lu aluminum garnets; hybrid photomultiplier; perovskites and orthosilicates; scintillation response;
fLanguage
English
Journal_Title
Nuclear Science, IEEE Transactions on
Publisher
ieee
ISSN
0018-9499
Type
jour
DOI
10.1109/TNS.2008.922840
Filename
4545161
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