Title :
Special section on the 2001 International Conference on Computer Design (ICCD)
Author_Institution :
Albert-Ludwig-University
fDate :
6/1/2003 12:00:00 AM
Keywords :
Circuit testing; Cryptography; Delay; Energy consumption; Large scale integration; Logic testing; Microprocessors; Pipelines; Special issues and sections; Very large scale integration;
Journal_Title :
Very Large Scale Integration (VLSI) Systems, IEEE Transactions on
DOI :
10.1109/TVLSI.2003.814044
