Title :
Detecting, diagnosing, and tolerating faults in SRAM-based field programmable gate arrays: a survey
Author :
Doumar, Abderrahim ; Ito, Hideo
Author_Institution :
Comput. Lab., Cambridge Univ., UK
fDate :
6/1/2003 12:00:00 AM
Abstract :
Topics related to the faults in SRAM-based field programmable gate arrays (FPGAs) have been intensively studied in recent research studies. These topics include FPGA fault detection, FPGA fault diagnosis, FPGA defect tolerance, and FPGA fault tolerance. This paper provides a guided tour to the approaches related to these topics. These include techniques, which are applied to the FPGA and others which have been recently introduced and can be applied to today´s FPGAs.
Keywords :
automatic testing; fault diagnosis; fault tolerance; field programmable gate arrays; integrated circuit testing; logic testing; random-access storage; SRAM-based field programmable gate arrays; defect tolerance; fault detection; fault diagnosis; fault tolerance; Fault detection; Fault diagnosis; Fault tolerance; Field programmable gate arrays; Indium tin oxide; Logic devices; Manufacturing; Production; Programmable logic arrays; Terminology;
Journal_Title :
Very Large Scale Integration (VLSI) Systems, IEEE Transactions on
DOI :
10.1109/TVLSI.2002.801609