• DocumentCode
    757994
  • Title

    Detecting, diagnosing, and tolerating faults in SRAM-based field programmable gate arrays: a survey

  • Author

    Doumar, Abderrahim ; Ito, Hideo

  • Author_Institution
    Comput. Lab., Cambridge Univ., UK
  • Volume
    11
  • Issue
    3
  • fYear
    2003
  • fDate
    6/1/2003 12:00:00 AM
  • Firstpage
    386
  • Lastpage
    405
  • Abstract
    Topics related to the faults in SRAM-based field programmable gate arrays (FPGAs) have been intensively studied in recent research studies. These topics include FPGA fault detection, FPGA fault diagnosis, FPGA defect tolerance, and FPGA fault tolerance. This paper provides a guided tour to the approaches related to these topics. These include techniques, which are applied to the FPGA and others which have been recently introduced and can be applied to today´s FPGAs.
  • Keywords
    automatic testing; fault diagnosis; fault tolerance; field programmable gate arrays; integrated circuit testing; logic testing; random-access storage; SRAM-based field programmable gate arrays; defect tolerance; fault detection; fault diagnosis; fault tolerance; Fault detection; Fault diagnosis; Fault tolerance; Field programmable gate arrays; Indium tin oxide; Logic devices; Manufacturing; Production; Programmable logic arrays; Terminology;
  • fLanguage
    English
  • Journal_Title
    Very Large Scale Integration (VLSI) Systems, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    1063-8210
  • Type

    jour

  • DOI
    10.1109/TVLSI.2002.801609
  • Filename
    1218213