DocumentCode
757994
Title
Detecting, diagnosing, and tolerating faults in SRAM-based field programmable gate arrays: a survey
Author
Doumar, Abderrahim ; Ito, Hideo
Author_Institution
Comput. Lab., Cambridge Univ., UK
Volume
11
Issue
3
fYear
2003
fDate
6/1/2003 12:00:00 AM
Firstpage
386
Lastpage
405
Abstract
Topics related to the faults in SRAM-based field programmable gate arrays (FPGAs) have been intensively studied in recent research studies. These topics include FPGA fault detection, FPGA fault diagnosis, FPGA defect tolerance, and FPGA fault tolerance. This paper provides a guided tour to the approaches related to these topics. These include techniques, which are applied to the FPGA and others which have been recently introduced and can be applied to today´s FPGAs.
Keywords
automatic testing; fault diagnosis; fault tolerance; field programmable gate arrays; integrated circuit testing; logic testing; random-access storage; SRAM-based field programmable gate arrays; defect tolerance; fault detection; fault diagnosis; fault tolerance; Fault detection; Fault diagnosis; Fault tolerance; Field programmable gate arrays; Indium tin oxide; Logic devices; Manufacturing; Production; Programmable logic arrays; Terminology;
fLanguage
English
Journal_Title
Very Large Scale Integration (VLSI) Systems, IEEE Transactions on
Publisher
ieee
ISSN
1063-8210
Type
jour
DOI
10.1109/TVLSI.2002.801609
Filename
1218213
Link To Document