• DocumentCode
    758006
  • Title

    Asymmetrical current conduction across a 50 A Thick aluminium gallium nitride polarisation barrier

  • Author

    Praharaj, C.J. ; Hwang, J. ; Eastman, L.F.

  • Author_Institution
    Dept. of Electr. Eng., Cornell Univ., NY
  • Volume
    1
  • Issue
    2
  • fYear
    2006
  • fDate
    12/1/2006 12:00:00 AM
  • Firstpage
    112
  • Lastpage
    115
  • Abstract
    Rectification by a 50 Aring (5 nm) thick aluminium gallium nitride (AlGaN) polarisation barrier with maximum voltage swing of 27 V is demonstrated. In order to achieve a large voltage swing, the device is constructed with a 3000 Aring (300 nm) thick undoped gallium nitride (GaN) space charge layer adjacent to the barrier to enable a large voltage drop before the advent of impact ionisation breakdown. The spontaneous and piezoelectric polarisation discontinuities at the AlGaN/GaN interfaces determine the band profiles and the thermally assisted tunneling flux of electrons through the barrier. The 3.24 MV cm -1 electric field across the 50 Aring thick barrier at low bias enables efficient tunneling of electrons, despite the large effective electron mass of 0.19. The effective barrier seen by electrons changes from triangular to trapezoidal for one direction of bias and enhances the asymmetry effect. The demonstrated device characteristics show that wide band-gap polarisation barriers can potentially be used as the basic components of high-power microwave limiters
  • Keywords
    III-V semiconductors; aluminium compounds; dielectric polarisation; electric breakdown; gallium compounds; impact ionisation; piezoelectric semiconductors; rectification; semiconductor heterojunctions; space charge; tunnelling; wide band gap semiconductors; 300 nm; 50 A; AlGaN-GaN; aluminium gallium nitride polarisation barrier; asymmetrical current conduction; asymmetry effect; band profiles; effective barrier; electron mass; high-power microwave limiters; impact ionisation breakdown; maximum voltage swing; piezoelectric polarisation discontinuities; rectification; space charge layer; thermally assisted tunneling flux; voltage drop; wide band-gap polarisation barriers;
  • fLanguage
    English
  • Journal_Title
    Micro & Nano Letters, IET
  • Publisher
    iet
  • ISSN
    1750-0443
  • Type

    jour

  • Filename
    4140882