Title :
Further improve circuit partitioning using GBAW logic perturbation techniques
Author :
Wu, Yu-Liang ; Cheung, Chak-Chung ; Cheng, David Ihsin ; Fan, Hongbing
Author_Institution :
Dept. of Comput. Sci. & Eng., Chinese Univ. of Hong Kong, China
fDate :
6/1/2003 12:00:00 AM
Abstract :
Efficient circuit partitioning is becoming more and more important as the size of modern circuits keeps increasing. Conventionally, circuit partitioning is solved without altering the circuit by modeling the circuit as a hypergraph for the ease of applying graph algorithms. However, there is room for further improvement on even optimal hypergraph partitioning results, if logic information can be applied for circuit perturbation. Such logic transformation based partitioning techniques are relatively less addressed. In this paper, we present a powerful multiway partitioning technique which applies efficient logic rewiring techniques for further improvement over already superior hypergraph partitioning results. The approach can integrate with any graph partitioner. We perform experiments on two-, three-, and four-way partitionings for MCNC benchmark circuits whose physical and logical information are both available. Our experimental results show that this partitioning approach is very powerful. For example, it can achieve a further 12.3% reduction in cut size upon already excellent pure graph partitioner (hMetis) results on two-way partitioning with an area penalty of only 0.34%. The outperforming results demonstrate the usefulness of this new partitioning technique.
Keywords :
graph theory; logic CAD; logic partitioning; GBAW logic perturbation techniques; MCNC benchmark circuits; area penalty; circuit partitioning; cut size; graph algorithms; hypergraph; logic information; logic rewiring techniques; logic transformation based partitioning; two-way partitioning; Clustering algorithms; Computer science; Field programmable gate arrays; Iterative algorithms; Logic circuits; Partitioning algorithms; Perturbation methods; Wires; Wiring;
Journal_Title :
Very Large Scale Integration (VLSI) Systems, IEEE Transactions on
DOI :
10.1109/TVLSI.2003.812369