Comparison between Californian and cyclotron SEU tests

Author

Velazco, R. ; Provost-Grellier, A. ; Chapuis, T. ; Labrunee, M. ; Falguere, D. ; Koga, R.

Author_Institution

LGI-UGM INPG, Grenoble, France

Volume

36

Issue

6

fYear

1989

fDate

12/1/1989 12:00:00 AM

Firstpage

2383

Lastpage

2387

Abstract

Experimental equipment for performing heavy-ion testing on programmable integrated circuits is presented. The equipment was used along with two different types of heavy-ion simulator to perform SEU (single-event-upset) tests on representative circuits: a dedicated Cf ²⁵² fission decay source and an 88-in cyclotron. The observed discrepancies between the two results obtained cast doubt on the validity of using californium sources to simulate high-LET (linear-energy-transfer) particles

Keywords

cyclotrons; environmental testing; integrated circuit testing; ion beam effects; ion sources; logic arrays; radiation hardening (electronics); 88 in; ²⁵²Cf source; cyclotron SEU tests; dedicated Cf²⁵² fission decay source; discrepancies; heavy-ion testing; high LET particles simulation; programmable integrated circuits; types of heavy-ion simulator; Aerospace testing; Circuit simulation; Circuit testing; Cyclotrons; Microcomputers; Performance evaluation; Random access memory; Single event upset; System testing; Test equipment;

fLanguage

English

Journal_Title

Nuclear Science, IEEE Transactions on

Publisher

ieee

ISSN

0018-9499

Type

jour

DOI

10.1109/23.45452

Filename

45452