Title :
Vibration modes of a resonant silicon tube density sensor
Author :
Enoksson, Peter ; Stemme, Göran ; Stemme, Erik
Author_Institution :
Dept. of Signals Sensors & Syst., R. Inst. of Technol., Stockholm, Sweden
fDate :
3/1/1996 12:00:00 AM
Abstract :
We present an investigation of the resonance parameters for a new sensor for on-line measurements of fluid density. The sensor consists of a tube system made of single crystalline silicon. The tube system is excited electrostatically into mechanical resonance and the vibration is detected optically. Using a simplified theoretical analysis, the resonance frequency can be shown to be proportional to 1√ρ, where ρ is the density of the silicon and the fluid weighted according to their areas in a cross section of the tube. Thus, a change in fluid density results in a change in the resonance frequency. This dependence is demonstrated by measurements for four different vibrations modes. The quality of the vibration is also investigated through measurements of the Q-values of the vibration modes. The tubes are made using anisotropic silicon KOH etching and silicon-to-silicon fusion bonding micromachining techniques. The dimensions of the tube system are 8.6×17.7 mm with an outer tube thickness of 1 mm and a wall thickness of 100 μm. Total tube length is 61 mm, and the sample volume is 0.035 ml. The sensor has a very good density sensitivity of the order of -200 ppm/(kgm-3) and a high Q of the order of 3000 for air in the tube
Keywords :
Q-factor; density measurement; elemental semiconductors; micromechanical resonators; microsensors; silicon; vibrations; Q-values; Si; anisotropic silicon KOH etching; electrostatic excitation; fluid density; mechanical resonance; on-line measurements; optical detection; resonant silicon tube density sensor; silicon-to-silicon fusion bonding micromachining; single crystalline silicon; vibration modes; Crystallization; Density measurement; Electrostatic measurements; Mechanical sensors; Optical detectors; Resonance; Resonant frequency; Sensor systems; Silicon; Vibration measurement;
Journal_Title :
Microelectromechanical Systems, Journal of