DocumentCode
75869
Title
Enhancement of radio frequency device´s contact test using a novel method
Author
Cheng-Nan Hu ; Wen-Ju Chen ; Hsuan-Chung Ko
Author_Institution
Dept. of Commun. Eng., Oriental Inst. of Technol., New-Taipei, Taiwan
Volume
8
Issue
4
fYear
2014
fDate
Jul-14
Firstpage
236
Lastpage
243
Abstract
This investigation describes novel automatic test equipment for verifying the electric contact of radio frequency (RF) traces between RF devices by, for example, the opens and shorts test. An equivalent circuit for modelling the RF device incorporating RF traces with contact impedance is applied for theoretical analysis of the prototype design. The effectiveness of the proposed novel test methodology is then validated. The measured data from experimental testing of RF devices attained in production runs precisely address the contact issue using the novel methodology presented here.
Keywords
automatic test equipment; equivalent circuits; integrated circuit modelling; integrated circuit testing; prototypes; radiofrequency integrated circuits; RF device modelling; automatic test equipment; electric contact verification; equivalent circuit; prototype design; radio frequency devices; radio frequency traces;
fLanguage
English
Journal_Title
Science, Measurement & Technology, IET
Publisher
iet
ISSN
1751-8822
Type
jour
DOI
10.1049/iet-smt.2013.0071
Filename
6847042
Link To Document