• DocumentCode
    75869
  • Title

    Enhancement of radio frequency device´s contact test using a novel method

  • Author

    Cheng-Nan Hu ; Wen-Ju Chen ; Hsuan-Chung Ko

  • Author_Institution
    Dept. of Commun. Eng., Oriental Inst. of Technol., New-Taipei, Taiwan
  • Volume
    8
  • Issue
    4
  • fYear
    2014
  • fDate
    Jul-14
  • Firstpage
    236
  • Lastpage
    243
  • Abstract
    This investigation describes novel automatic test equipment for verifying the electric contact of radio frequency (RF) traces between RF devices by, for example, the opens and shorts test. An equivalent circuit for modelling the RF device incorporating RF traces with contact impedance is applied for theoretical analysis of the prototype design. The effectiveness of the proposed novel test methodology is then validated. The measured data from experimental testing of RF devices attained in production runs precisely address the contact issue using the novel methodology presented here.
  • Keywords
    automatic test equipment; equivalent circuits; integrated circuit modelling; integrated circuit testing; prototypes; radiofrequency integrated circuits; RF device modelling; automatic test equipment; electric contact verification; equivalent circuit; prototype design; radio frequency devices; radio frequency traces;
  • fLanguage
    English
  • Journal_Title
    Science, Measurement & Technology, IET
  • Publisher
    iet
  • ISSN
    1751-8822
  • Type

    jour

  • DOI
    10.1049/iet-smt.2013.0071
  • Filename
    6847042