Effect of annealing and polishing on flashover characteristics of ceramic in vacuum

Author

Shioiri, T. ; Shindo, T. ; Kamikawaji, T. ; Kaneko, E. ; Ohshima, I.

Author_Institution

Toshiba Corp., Tokyo, Japan

Volume

9

Issue

3

fYear

2002

fDate

6/1/2002 12:00:00 AM

Firstpage

416

Lastpage

420

Abstract

Experiments were carried out to study the effects of surface polishing and annealing of ceramic specimens on the dielectric breakdown characteristics of their surfaces. It was found that when the samples were annealed at 1000°C, allowing the residual stresses in their surfaces to decrease, the breakdown voltage rose, whereas with the polished samples, reductions of residual stresses resulted in a slight rise of the breakdown voltage. Prior to dielectric breakdown, a surface glow was observed, due to luminescence from electron bombardment and insulator surface defects. The starting voltage of luminescence rose when residual stresses were reduced. It is suggested that the mechanical strain due to surface defects contributes to dielectric breakdowns on ceramic surfaces

Keywords

annealing; ceramic insulators; flashover; internal stresses; luminescence; polishing; 1000 C; annealing effects; breakdown voltage; ceramic insulator; ceramic surfaces; dielectric breakdown characteristics; electron bombardment induced luminescence; flashover characteristics; mechanical strain; residual stresses; surface defects; surface glow; surface polishing effects; Annealing; Capacitive sensors; Ceramics; Dielectric breakdown; Dielectrics and electrical insulation; Electrons; Flashover; Luminescence; Residual stresses; Voltage;

fLanguage

English

Journal_Title

Dielectrics and Electrical Insulation, IEEE Transactions on

Publisher

ieee

ISSN

1070-9878

Type

jour

DOI

10.1109/TDEI.2002.1007705

Filename

1007705