A high-frequency double-sampling second-order ΔΣ modulator

As the minimum feature size of VLSI technologies scales down, more of the signal processing tasks are performed in the digital domain. This results in increased speed, resolution, and dynamic range requirements for the analog-to-digital converter (ADC). High-speed and high-accuracy designs can be achieved by using oversampling ADC structures, which demand amplifiers with a high gain and a high unity-gain frequency. Due to the difficulty to meet both of these specifications, the ADC resolution at a frequency in the megahertz range appears to be limited by amplifier settling requirements. Design techniques to improve the ADC performance are presented. The proposed modulator structure uses the double-sampled technique, which increases by a factor of two the maximum speed of operation and correctly operates even with low dc gain amplifiers. Furthermore, the signal-to-noise ratio is significantly improved by a calibration stage, which dynamically estimates the offset errors to be removed by a simple subtraction from the output signal.