• DocumentCode
    758830
  • Title

    Limiting equivalent electric field response in Ar+SF6 subjected to orthogonal electric and magnetic fields

  • Author

    Dincer, M.S. ; Hiziroglu, H.R.

  • Author_Institution
    Dept. of Electr. & Electron. Eng., Gazi Univ., Ankara, Turkey
  • Volume
    9
  • Issue
    3
  • fYear
    2002
  • fDate
    6/1/2002 12:00:00 AM
  • Firstpage
    428
  • Lastpage
    432
  • Abstract
    The limiting equivalent electric fields in Ar+SF6 binary gas mixtures due to Townsend discharges are evaluated directly from a Monte-Carlo simulation when the mixture is subjected to orthogonal electric and magnetic fields. Along with the limiting equivalent electric fields, transverse and perpendicular drift velocities, electron mean energies and collision frequencies are also determined within the scope of the Monte-Carlo simulation. The equivalent reduced electric field (EREF) concept for the corresponding limiting electric fields is also investigated for the calculated mean energy levels and collision frequencies. The EREF values are found to be in good agreement with the previously published limiting electric field data
  • Keywords
    Monte Carlo methods; Townsend discharge; argon; electric fields; electric strength; electron avalanches; molecule-electron collisions; sulphur compounds; Ar; Ar-SF6; Lorentz force equation; Monte-Carlo simulation; Ramsauer-Townsend effect; SF6; Townsend discharges; binary electron-molecule collisions; binary gas mixtures; dielectric strength; electron collision frequencies; electron mean energies; electron swarms; limiting crossed fields; limiting equivalent electric field response; orthogonal electric fields; orthogonal magnetic fields; perpendicular drift velocities; transverse drift velocities; Analytical models; Argon; Electron mobility; Equations; Frequency; Magnetic analysis; Magnetic fields; Plasma properties; Predictive models; Sulfur hexafluoride;
  • fLanguage
    English
  • Journal_Title
    Dielectrics and Electrical Insulation, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    1070-9878
  • Type

    jour

  • DOI
    10.1109/TDEI.2002.1007707
  • Filename
    1007707