Title :
Intensity Noise Distribution of Semiconductor Lasers Measured Using Bit-Error-Rate Testers
Author :
Chen, Kuo-Liang ; Wang, Charlie ; Wilks, John
Author_Institution :
Feng Chia Univ., San Jose, CA
Abstract :
Laser noise has been well studied both theoretically and experimentally. Most of the previous experimental work examined the standard deviation of the noise, with the implicit assumption of a Gaussian noise distribution. We employ a new approach to measure the semiconductor laser noise distribution down to a bit-error ratio (BER) of 10-11. This method takes advantage of the high sampling rate of modern BER testers. We found that the noise distribution for a 1310-nm Fabry-Perot laser and a 1550-nm distributed-feedback laser are well fitted by Gaussian distributions
Keywords :
distributed feedback lasers; error statistics; laser noise; laser variables measurement; semiconductor lasers; 1310 nm; 1550 nm; Fabry-Perot laser; bit-error-rate; distributed-feedback laser; intensity noise; semiconductor lasers; Bit error rate; Gaussian noise; Laser modes; Laser noise; Laser theory; Noise measurement; Semiconductor device noise; Semiconductor device testing; Semiconductor lasers; Signal to noise ratio; Noise; noise measurement; optical fiber communication; probability; semiconductor lasers;
Journal_Title :
Photonics Technology Letters, IEEE
DOI :
10.1109/LPT.2006.883255
