• DocumentCode
    759294
  • Title

    Assessment of available transfer capability and margins

  • Author

    Ou, Yan ; Singh, Chanan

  • Author_Institution
    Dept. of Electr. Eng., Texas A&M Univ., College Station, TX, USA
  • Volume
    17
  • Issue
    2
  • fYear
    2002
  • fDate
    5/1/2002 12:00:00 AM
  • Firstpage
    463
  • Lastpage
    468
  • Abstract
    Available transfer capability (ATC) calculation is a complicated task, which involves the determination of total transfer capability (TTC) and two margins-transmission reliability margin (TRM) and capacity benefit margin (CBM). Three currently used methods of TTC determination are presented and compared in this paper. Besides these methods, transfer-based security constrained OPF (TSCOPF) method is proposed in this paper as a replacement of conventional SCOPF method, for use in the deregulation environment. Both TRM and CBM, which account for reliability of the system, are seldom mentioned in the papers associated with ATC. This paper presents a probabilistic method to assess TRM, proposes rules and a procedure to allocate CBM and two methods of incorporating CBM into ATC. A modified IEEE RTS is utilized to demonstrate the proposed methods and the results show that the values of ATC are quite different when margins are taken into account and the methods of incorporating ATC affect the ATC value significantly
  • Keywords
    load flow; power transmission; power transmission reliability; probability; available transfer capability; capacity benefit margin; deregulation environment; modified IEEE RTS; optimal power flow; probabilistic method; total transfer capability; transfer-based security constrained OPF; transmission reliability margin; Constraint optimization; Information systems; Load flow; Neural networks; Power engineering computing; Power system interconnection; Power system reliability; Power system security; Transmission line measurements; Uncertainty;
  • fLanguage
    English
  • Journal_Title
    Power Systems, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0885-8950
  • Type

    jour

  • DOI
    10.1109/TPWRS.2002.1007919
  • Filename
    1007919