DocumentCode :
759358
Title :
Evaluating Sensor Reliability in Classification Problems Based on Evidence Theory
Author :
Guo, Huawei ; Shi, Wenkang ; Deng, Yong
Author_Institution :
Sch. of Electron., Inf. & Electr. Eng., Shanghai Jiao Tong Univ.
Volume :
36
Issue :
5
fYear :
2006
Firstpage :
970
Lastpage :
981
Abstract :
This paper presents a new framework for sensor reliability evaluation in classification problems based on evidence theory (or the Dempster-Shafer theory of belief functions). The evaluation is treated as a two-stage training process. First, the authors assess the static reliability from a training set by comparing the sensor classification readings with the actual values of data, which are both represented by belief functions. Information content contained in the actual values of each target is extracted to determine its influence on the evaluation. Next, considering the ability of the sensor to understand a dynamic working environment, the dynamic reliability is evaluated by measuring the degree of consensus among a group of sensors. Finally, the authors discuss why and how to combine these two kinds of reliabilities. A significant improvement using the authors´ method is observed in numerical simulations as compared with the recently proposed method
Keywords :
belief maintenance; learning (artificial intelligence); pattern classification; reliability theory; sensor fusion; uncertainty handling; Dempster-Shafer theory; belief function; evidence theory; pattern classification problem; sensor reliability evaluation; supervised learning; training process; Data mining; Image sensors; Numerical simulation; Reliability theory; Sensor fusion; Sensor phenomena and characterization; Sensor systems; Temperature sensors; Uncertainty; Working environment noise; Belief functions; contextual information; discounting factor; evidence distance; evidence theory; pattern classification; sensor reliability; supervised learning;
fLanguage :
English
Journal_Title :
Systems, Man, and Cybernetics, Part B: Cybernetics, IEEE Transactions on
Publisher :
ieee
ISSN :
1083-4419
Type :
jour
DOI :
10.1109/TSMCB.2006.872269
Filename :
1703642
Link To Document :
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