• DocumentCode
    759433
  • Title

    Kerr electro-optic field mapping and charge dynamics in impurity-doped transformer oil

  • Author

    Hikita, M. ; Matsuoka, M. ; Shimizu, R. ; Kato, K. ; Hayakawa, N. ; Okubo, H.

  • Author_Institution
    Nagoya Univ., Japan
  • Volume
    3
  • Issue
    1
  • fYear
    1996
  • fDate
    2/1/1996 12:00:00 AM
  • Firstpage
    80
  • Lastpage
    86
  • Abstract
    We measured dc electric field distribution in transformer oil mixed with different impurities and additives so as to simulate practical degradation conditions of transformer oil. The electric field in the oil doped with asphalt was reduced near the cathode and enhanced near the anode. On the other hand, electric field in oil with copper oleate was enhanced near both electrodes and reduced at the center between the electrodes. The space charge density was estimated from the measured electric field profile using a 1-dimensional form of Gauss law; negative ions occurred more than positive ions by 5 to 40 pC/cm3 in the oil with asphalt from 10 to 30 ppm. It was also found that heterocharges with 100 to 300 pC/cm3 existed near both electrodes in the oil with copper oleate. Consequently, the electric field and the charge distribution in the oil proved to change depending on the kind and content of impurities or additives and thus depending on the degradation of the oil
  • Keywords
    Kerr electro-optical effect; insulator contamination; space charge; transformer oil; DC electric field distribution; Kerr electro-optic field mapping; additives; asphalt; charge distribution; charge dynamics; copper oleate; degradation; heterocharges; impurity doping; negative ions; one-dimensional Gauss law; positive ions; space charge density; transformer oil; Asphalt; Cathodes; Charge carrier processes; Copper; Degradation; Electric variables measurement; Electrodes; Impurities; Oil insulation; Petroleum;
  • fLanguage
    English
  • Journal_Title
    Dielectrics and Electrical Insulation, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    1070-9878
  • Type

    jour

  • DOI
    10.1109/94.485518
  • Filename
    485518