Title :
Response of GaAs displacement damage monitors to protons, electrons, and gamma radiation
Author :
Barry, Albert L. ; Wojcik, Richard ; MacDiarmid, Andrew L.
Author_Institution :
Commun. Res. Centre, Ottawa, Ont., Canada
fDate :
12/1/1989 12:00:00 AM
Abstract :
The need to characterize the radiation hardness of certain classes of devices in terms of atomic displacement damage rather than total absorbed dose is addressed. Resistive-network displacement damage monitors irradiated with 1.0-MeV protons and 7.3-MeV electrons indicate that these radiations are both about twenty times as damaging as 60 Co gamma radiation for the same total absorbed dose. Preliminary results are presented on an alternative monitor consisting of a GaAs LED (light-emitting diode) that offers a two-order-of-magnitude increase in sensitivity over the resistive network monitors. Other characteristics of the two monitors, such as range, linearity, annealing and reuse, and neutron sensitivity, are compared
Keywords :
III-V semiconductors; dosimeters; electron beam effects; environmental testing; gallium arsenide; gamma-ray effects; light emitting diodes; proton effects; radiation hardening (electronics); radiation monitoring; resistors; semiconductor technology; 1 MeV; 7.3 MeV; 60Co gamma radiation; GaAs LED; GaAs displacement damage monitors; annealing; atomic displacement damage; characteristics; electrons; gamma radiation; increase in sensitivity; light-emitting diode; linearity; neutron sensitivity; protons; radiation hardness; range; resistive network monitors; reuse; semiconductors; total absorbed dose; Atomic measurements; Character recognition; Degradation; Electrons; Gallium arsenide; Gamma rays; Insulation; Protons; Semiconductor device measurement; Testing;
Journal_Title :
Nuclear Science, IEEE Transactions on