• DocumentCode
    759518
  • Title

    Guest editorial: Special section on compound semiconductor microelectronics manufacturing: The future is here

  • Author

    Jaeger, Richard C. ; del Alamo, Jesus A. ; Fukuta, Masahiro ; Bennett, H.S. ; Snowden, C.M.

  • Author_Institution
    Agilent Technologies
  • Volume
    16
  • Issue
    3
  • fYear
    2003
  • Firstpage
    354
  • Lastpage
    356
  • Keywords
    Circuit testing; Consumer electronics; Electronic equipment testing; Gallium arsenide; Laboratories; Microelectronics; Semiconductor device manufacture; Silicon; Technology management; USA Councils;
  • fLanguage
    English
  • Journal_Title
    Semiconductor Manufacturing, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0894-6507
  • Type

    jour

  • DOI
    10.1109/TSM.2003.815634
  • Filename
    1219477