• DocumentCode
    759587
  • Title

    High-power performance of single-mode fiber-optic connectors

  • Author

    De Rosa, Michael ; Carberry, Joel ; Bhagavatula, Venkata ; Wagner, Karl ; Saravanos, Costas

  • Author_Institution
    Sci. & Technol. Div., Corning Inc., NY, USA
  • Volume
    20
  • Issue
    5
  • fYear
    2002
  • fDate
    5/1/2002 12:00:00 AM
  • Firstpage
    879
  • Lastpage
    885
  • Abstract
    We measured the continuous wave (CW) laser-induced damage threshold of single-mode fiber-optic connectors at 1550 nm. Clean standard physical contact and angled physical contact connectors did not show any evidence of damage for 10 min exposures of 1 W or 3 W. Defective connectors with scratched or undercut endfaces showed identical high-power tolerance as clean connectors without defects. Samples contaminated with carbon black-doped acrylate showed drastic optical failure signatures at approximately 50 mW. Contaminated connectors with expanded mode field diameters ranging from 20 to 62 μm showed higher failure thresholds than standard connectors with 10-μm spot sizes. We observed that the optical failure threshold power level (Pfailure) increased linearly with spot size for the highly contaminated connectors used in this study.
  • Keywords
    failure analysis; impurities; laser beam effects; optical fibre couplers; reliability; 1 W; 10 micron; 10 min; 1550 nm; 20 to 62 micron; 3 W; 50 mW; CW laser-induced damage threshold; angled physical contact connectors; carbon black-doped acrylate; clean standard physical contact connectors; contaminated connectors; expanded mode field diameters; failure thresholds; high-power performance; optical failure signatures; optical failure threshold power level; scratched endfaces; single-mode fiber-optic connectors; undercut endfaces; Connectors; Contacts; Dielectric breakdown; Dielectric materials; Fiber lasers; Impurities; Laser theory; Optical materials; Power lasers; Stimulated emission;
  • fLanguage
    English
  • Journal_Title
    Lightwave Technology, Journal of
  • Publisher
    ieee
  • ISSN
    0733-8724
  • Type

    jour

  • DOI
    10.1109/JLT.2002.1007944
  • Filename
    1007944