DocumentCode :
759763
Title :
A new scheduling approach using combined dispatching criteria in wafer fabs
Author :
Dabbas, Russ M. ; Fowler, John W.
Author_Institution :
Semicond. Product Sector, Motorola Inc., Phoenix, AZ, USA
Volume :
16
Issue :
3
fYear :
2003
Firstpage :
501
Lastpage :
510
Abstract :
In this paper, a scheduling approach that combines multiple dispatching criteria into a single rule, with the objective of simultaneously optimizing multiple performance measures is proposed. This is accomplished using a linear combination with relative weights. The weights identify the contribution of the different criteria. The weights´ assignments to the different criteria are optimized using a mixture design of experiments (DOE) and multiple response optimization. Results using this new approach show significant improvement versus the use of a single dispatching criterion.
Keywords :
design of experiments; dispatching; integrated circuit manufacture; optimisation; production control; combined dispatching criteria; mixture DOE; mixture design of experiments; multiple dispatching criteria; multiple performance measures optimization; multiple response optimization; scheduling approach; semiconductor manufacturing; wafer fabrication; wafer fabs; Business; Design optimization; Dispatching; Fabrication; Failure analysis; Job shop scheduling; Manufacturing processes; Production facilities; Semiconductor device manufacture; US Department of Energy;
fLanguage :
English
Journal_Title :
Semiconductor Manufacturing, IEEE Transactions on
Publisher :
ieee
ISSN :
0894-6507
Type :
jour
DOI :
10.1109/TSM.2003.815201
Filename :
1219498
Link To Document :
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