DocumentCode :
759785
Title :
Influence of hot carrier transport on the transient response of an InGaAs/InAlAs metal-semiconductor Schottky diode structure
Author :
Salem, Ali F. ; Brennan, Kevin F.
Author_Institution :
Sch. of Electr. Eng., Georgia Inst. of Technol., Atlanta, GA, USA
Volume :
43
Issue :
4
fYear :
1996
fDate :
4/1/1996 12:00:00 AM
Firstpage :
664
Lastpage :
665
Abstract :
The calculated transient characteristic of a heterostructure, rectifying contact is theoretically examined. It is found that hot carrier transport drastically affects the output terminal characteristics of the heterostructure Schottky contact and, hence, the workings of a blocking contact. This is of importance to the understanding of InGaAs MSM devices in particular, as well as any structure which contains a blocking contact in general
Keywords :
III-V semiconductors; Schottky diodes; aluminium compounds; gallium arsenide; hot carriers; indium compounds; metal-semiconductor-metal structures; semiconductor device models; transient analysis; InGaAs-InAlAs; MSM devices; blocking contact; hot carrier transport; metal-semiconductor Schottky diode structure; output terminal characteristics; rectifying contact; transient response; Charge carrier processes; Dark current; High definition video; Hot carriers; Indium compounds; Indium gallium arsenide; Schottky barriers; Schottky diodes; Thermionic emission; Transient response;
fLanguage :
English
Journal_Title :
Electron Devices, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9383
Type :
jour
DOI :
10.1109/16.485551
Filename :
485551
Link To Document :
بازگشت