• DocumentCode
    759846
  • Title

    Cost of ownership model for inspection of multiple quality attributes

  • Author

    Sohn, So Young ; Moon, Hyoung Uk

  • Author_Institution
    Dept. of Comput. Sci. & Ind. Syst. Eng., Yonsei Univ., Seoul, South Korea
  • Volume
    16
  • Issue
    3
  • fYear
    2003
  • Firstpage
    565
  • Lastpage
    571
  • Abstract
    Procurement decisions for inspection equipment are often made heavily based on the initial purchase price instead of the effects of inspection cost, equipment calibration, and utilization over the lifetime. Cost of ownership (COO) models that take into account all of these cost factors together have been developed focusing on a single quality characteristic. In the modern manufacturing environment, inspection equipment often can deal with more than one quality characteristic simultaneously. The authors propose a revised COO model for the economic evaluation of inspection equipment that can accommodate multiple quality characteristics. They also employ an engineering economy model to compare equipment with different life spans. Software is developed for handy comparison of the COO of alternative equipment along with sensitivity analysis for the optimal procurement decision.
  • Keywords
    costing; inspection; integrated circuit economics; sensitivity analysis; calibration; computer software; cost of ownership model; engineering economy model; inspection equipment; life span; multiple quality attributes; procurement decision; semiconductor manufacturing; sensitivity analysis; Calibration; Costs; Environmental economics; Inspection; Manufacturing; Moon; Plasma displays; Procurement; Sensitivity analysis; Thin film transistors;
  • fLanguage
    English
  • Journal_Title
    Semiconductor Manufacturing, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0894-6507
  • Type

    jour

  • DOI
    10.1109/TSM.2003.815897
  • Filename
    1219505