DocumentCode :
759846
Title :
Cost of ownership model for inspection of multiple quality attributes
Author :
Sohn, So Young ; Moon, Hyoung Uk
Author_Institution :
Dept. of Comput. Sci. & Ind. Syst. Eng., Yonsei Univ., Seoul, South Korea
Volume :
16
Issue :
3
fYear :
2003
Firstpage :
565
Lastpage :
571
Abstract :
Procurement decisions for inspection equipment are often made heavily based on the initial purchase price instead of the effects of inspection cost, equipment calibration, and utilization over the lifetime. Cost of ownership (COO) models that take into account all of these cost factors together have been developed focusing on a single quality characteristic. In the modern manufacturing environment, inspection equipment often can deal with more than one quality characteristic simultaneously. The authors propose a revised COO model for the economic evaluation of inspection equipment that can accommodate multiple quality characteristics. They also employ an engineering economy model to compare equipment with different life spans. Software is developed for handy comparison of the COO of alternative equipment along with sensitivity analysis for the optimal procurement decision.
Keywords :
costing; inspection; integrated circuit economics; sensitivity analysis; calibration; computer software; cost of ownership model; engineering economy model; inspection equipment; life span; multiple quality attributes; procurement decision; semiconductor manufacturing; sensitivity analysis; Calibration; Costs; Environmental economics; Inspection; Manufacturing; Moon; Plasma displays; Procurement; Sensitivity analysis; Thin film transistors;
fLanguage :
English
Journal_Title :
Semiconductor Manufacturing, IEEE Transactions on
Publisher :
ieee
ISSN :
0894-6507
Type :
jour
DOI :
10.1109/TSM.2003.815897
Filename :
1219505
Link To Document :
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