Title :
Closure to discussion of "z-bus loss allocation"
Author :
Conejo, Antonio J. ; Galiana, Francisco D. ; Kockar, Ivana
Author_Institution :
McGill University
fDate :
5/1/2002 12:00:00 AM
Keywords :
Analytical models; Image analysis; Impedance; Load flow; Shunt (electrical); Testing; Voltage;
Journal_Title :
Power Systems, IEEE Transactions on
DOI :
10.1109/TPWRS.2002.1008372
