DocumentCode :
760035
Title :
Test zone field compensation
Author :
Black, Donald N., Jr. ; Joy, Edward B.
Author_Institution :
Sch. of Electr. & Comput. Sci., Georgia Inst. of Technol., Atlanta, GA, USA
Volume :
43
Issue :
4
fYear :
1995
fDate :
4/1/1995 12:00:00 AM
Firstpage :
362
Lastpage :
368
Abstract :
Test zone field (TZF) compensation increases antenna pattern measurement accuracy by compensating for extraneous fields created by reflection and scattering of the range antenna field from fixed objects in the range and by leakage of the range RF system from a fixed location in the range. TZF compensation can be used on fixed line-of-sight (static) far-field, compact, and near-field ranges. Other compensation techniques are seldom used in practical measurement situations because they are limited in the amount of compensation they provide. These techniques do not adequately model the type of extraneous field present in the range or require increased measurement time and equipment necessary to implement the technique. TZF compensation overcomes these limits as follows. The TZF is measured over a spherical surface encompassing the test zone using a low gain probe. The measured TZF is used antenna pattern measurements to compensate for extraneous fields. TZF compensation theory is presented and demonstrated using measured data
Keywords :
antenna radiation patterns; antenna testing; electromagnetic wave reflection; electromagnetic wave scattering; gain measurement; probes; antenna pattern measurement accuracy; compact range; compensation theory; extraneous fields; gain measurement; line-of-sight far-field range; low gain probe; measured data; near-field ranges; range RF system leakage; range antenna field; reflection; scattering; spherical surface; static far-field range; test zone field compensation; Antenna measurements; Coordinate measuring machines; Information analysis; Pattern analysis; Polarization; Probes; Radio frequency; Reflection; Scattering; Testing;
fLanguage :
English
Journal_Title :
Antennas and Propagation, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-926X
Type :
jour
DOI :
10.1109/8.376033
Filename :
376033
Link To Document :
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