• DocumentCode
    760133
  • Title

    Scattering analysis of conducting bodies of revolution using fictitious currents and point-matching

  • Author

    Na, Hyung-Gi ; Kim, Hyo-Tae

  • Author_Institution
    Dept. of Electr. Eng., Pohang Inst. of Sci. & Technol., South Korea
  • Volume
    43
  • Issue
    4
  • fYear
    1995
  • fDate
    4/1/1995 12:00:00 AM
  • Firstpage
    426
  • Lastpage
    430
  • Abstract
    In this paper, a fictitious current model using point-matching is introduced for the electromagnetic scattering problem of a conducting body of revolution. To take advantage of the rotational symmetry of a scatterer, test points and source points are assumed to have φ-dependence of ejnφ and are grouped into test loops and source loops, respectively. The number of sample points in each loop is determined in proportion to the length of the loop. Thus, the range of orders to be considered in each loop is dependent on the length of the loop. The field components of higher order modes which can arise due to aliasing are removed using appropriate approximations. Since the current sources and the boundary condition testing are of point-form, the numerical evaluation of the matrix elements is simple and fast. Numerical results are compared with other methods, and the numerical efficiencies obtained with this method are discussed
  • Keywords
    boundary-value problems; electromagnetic wave scattering; numerical analysis; boundary condition testing; conducting bodies of revolution; electromagnetic scattering problem; fictitious current model; field components; higher order modes; matrix elements; numerical efficiencies; numerical evaluation; point-matching; rotational symmetry; scattering analysis; source loops; source points; test loops; test points; Antennas and propagation; Conductors; Dispersion; Electromagnetic scattering; Finite difference methods; Frequency; Maxwell equations; Microwave propagation; Plasmas; Time domain analysis;
  • fLanguage
    English
  • Journal_Title
    Antennas and Propagation, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-926X
  • Type

    jour

  • DOI
    10.1109/8.376043
  • Filename
    376043