Title :
Formal Methods for Early Analysis of Functional Reliability in Component-Based Embedded Applications
Author :
Hazra, A. ; Ghosh, Prosenjit ; Vadlamudi, Satya Gautam ; Chakrabarti, Partha Pratim ; Dasgupta, Parthasarathi
Author_Institution :
Dept. of Comput. Sci. & Eng., IIT Kharagpur, Kharagpur, India
Abstract :
We present formal methods for determining whether a set of components with given reliability certificates for specific functional properties are adequate to guarantee desired end-to-end properties with specified reliability requirements. We introduce a formal notion for the reliability gap in component-based designs and demonstrate the proposed approach for analyzing this gap using a case study developed around an Elevator Control System.
Keywords :
embedded systems; formal verification; reliability; component-based designs; component-based embedded applications; elevator control system; formal methods; functional reliability; reliability certificates; reliability gap; specific functional properties; Control systems; Elevators; Embedded systems; Software reliability; Unified modeling language; Vectors; Design and validation; embedded system; functional reliability; reliability gap;
Journal_Title :
Embedded Systems Letters, IEEE
DOI :
10.1109/LES.2013.2239605
