DocumentCode :
760313
Title :
Small dimension Bragg reflectors formed by air-isolated GaAs layers
Author :
Hummel, S. ; Frateschi, Newton ; Dapkus, P.D.
Volume :
27
Issue :
7
fYear :
1991
fDate :
3/28/1991 12:00:00 AM
Firstpage :
588
Lastpage :
590
Abstract :
Demonstrates a process for the fabrication of air-isolated microstructures based upon impurity diffusion disordering and selective etching of multilayer structures. The process is illustrated by the fabrication of 5 and 22 mu m wide Bragg reflectors with reflectivities in excess of 95%.
Keywords :
III-V semiconductors; diffusion in solids; distributed Bragg reflector lasers; etching; gallium arsenide; semiconductor junction lasers; 22 micron; 5 micron; Bragg reflectors; air-isolated microstructures; impurity diffusion disordering; multilayer structures; reflectivities; selective etching;
fLanguage :
English
Journal_Title :
Electronics Letters
Publisher :
iet
ISSN :
0013-5194
Type :
jour
DOI :
10.1049/el:19910371
Filename :
100853
Link To Document :
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