Title :
Importance sampling techniques for efficient simulation of stack decoders
Author :
Letaief, Khaled ; Sadowsky, John S.
Author_Institution :
Dept. of Electr. & Electron. Eng., Melbourne Univ., Parkville, Vic., Australia
fDate :
3/28/1991 12:00:00 AM
Abstract :
Importance sampling is a Monte Carlo simulation technique which has been recognised as a powerful tool for simulating low probability events. This letter presents new efficient importance sampling simulation schemes for estimating the distribution of computation for sequential decoders that employ the stack algorithm.
Keywords :
Monte Carlo methods; decoding; Monte Carlo simulation technique; importance sampling simulation schemes; low probability events; sequential decoders; stack decoders;
Journal_Title :
Electronics Letters
DOI :
10.1049/el:19910374
