Title :
A Controlled-Temperature Device for Transistor Tests
Author :
King, E.F. ; Walker, F.L.
Author_Institution :
Elec. Engrg. Dept., University of California, Los Angeles, Calif.
fDate :
3/1/1961 12:00:00 AM
Abstract :
A laboratory device for operating transistors at selected, known temperatures in the 15-95-degrees C range is described. After a simple, one-time calibration no further temperature measurements are necessary. The unit is simple, rugged and easily constructed.
Keywords :
Aluminum; Calibration; Electrical resistance measurement; Laboratories; Leg; Resistors; Temperature measurement; Testing; Thermal conductivity; Time measurement;
Journal_Title :
Education, IRE Transactions on
DOI :
10.1109/TE.1961.4322170
