Title :
An efficient parameter extraction algorithm for MOS transistor models
Author :
Karlsson, Peter R. ; Jeppson, Kjell O.
Author_Institution :
Dept. of Solid State Electron., Chalmers Univ. of Technol., Goteborg, Sweden
fDate :
9/1/1992 12:00:00 AM
Abstract :
A general, direct parameter extraction algorithm that uses a small number of data points has been developed for MOS transistor models. This extraction algorithm has been tested using two transistor models in SPICE, MOS3, and BSIM. The basic idea of the algorithm is to use only one data point for each transistor parameter. Appropriate selection of the data points ensures physically reasonable values of most extracted parameters. Analytical expressions or rapidly converging numerical equations are used to calculate the parameters. Interaction between different parameters are taken into account. Good agreement between measured and simulated data is obtained from only 15 and 25 data points for MOS3 and BSIM, respectively. The total extraction time for a single transistor is around 40 s for MOS3 and 1 min for BSIM
Keywords :
electronic engineering computing; insulated gate field effect transistors; semiconductor device models; BSIM; MOS transistor models; MOS3; SPICE; parameter extraction algorithm; transistor parameter; Circuit simulation; Data mining; Equations; Integrated circuit modeling; MOSFETs; Parameter extraction; Production control; SPICE; Semiconductor device modeling; Threshold voltage;
Journal_Title :
Electron Devices, IEEE Transactions on
